Modern applications of a new 300 kV field emission transmission electron microscope to the study of advanced materials

Conference proceeding

Peer reviewed

Y Bando, K Kurashima and S Nakano

Journal of the European Ceramic Society, Vol.16(3), pp.379-384

Modern applications of electron and scanning probe microscopies to ceramics

1996

Abstract

Condensed matter: structure, mechanical and thermal properties

Electron, ion, and scanning probe microscopy

Electron, positron and ion microscopes, electron diffractometers and related techniques

Exact sciences and technology

General

Instruments, apparatus, components and techniques common to several branches of physics and astronomy

Physics

Structure of solids and liquids; crystallography

Transmission, reflection and scanning electron microscopy(including ebic)

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Title: Modern applications of a new 300 kV field emission transmission electron microscope to the study of advanced materials
Creators - without role: Y Bando - National Institute for Materials Science
K Kurashima - National Institute for Materials Science
S Nakano - National Institute for Materials Science
Publication Details: Journal of the European Ceramic Society, Vol.16(3), pp.379-384
Conference: Modern applications of electron and scanning probe microscopies to ceramics
Publisher: Elsevier
Grant note: European Ceramic Society
Identifiers: 9952384708331
Academic Unit: King Saud University
Language: English
Resource Type: Conference proceeding