On comparing color spaces for fabric defect classification based on local binary patterns

Vinh Truong Hoang; Ali Rebhi

Back

Conference proceeding

On comparing color spaces for fabric defect classification based on local binary patterns

Vinh Truong Hoang and Ali Rebhi

The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.297

01/01/2018

Abstract

Classification

Color

Defects

Image processing

Signal processing

Support vector machines

Conference Title: 2018 IEEE 3rd International Conference on Signal and Image Processing (ICSIP) Conference Start Date: 2018, July 13 Conference End Date: 2018, July 15 Conference Location: Shenzhen, China There is a numerous color spaces with different properties in literature. In order to find the appropriate and relevant color space for the fabric defect classification problem, we propose to investigate the performance and robustness of the Local Binary Pattern (LBP) descriptor in supervised context by using SVM classifier. The experimental results show that the luminance-chrominance spaces are suitable for coding fabric defect with the classification accuracy obtained is 92.1%

Metrics

1 Record Views

Details

Title: On comparing color spaces for fabric defect classification based on local binary patterns
Creators - without role: Vinh Truong Hoang
Ali Rebhi
Publication Details: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.297
Publisher: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Identifiers: 9932373908331
Academic Unit: University Ha'il
Language: English
Resource Type: Conference proceeding