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On statistical behavior of branch coverage in testing behavioral VHDL models
Conference proceeding

On statistical behavior of branch coverage in testing behavioral VHDL models

A. Hajjar, T. Chen, A. von Mayrhauser and IEEE COMPUTER SOCIETY
Proceedings IEEE International High-Level Design Validation and Test Workshop (Cat. No.PR00786), Vol.2000-, pp.89-94
2000

Abstract

Algorithm design and analysis Computational modeling Computer science Computer simulation Hardware Software engineering Software measurement Software testing Time to market

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