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On the Sparsification of the Reluctance Matrix in RLCk Circuit Transient Analysis
Conference proceeding

On the Sparsification of the Reluctance Matrix in RLCk Circuit Transient Analysis

Charalampos Antoniadis, Nestor Evmorfopoulos and Georgios Stamoulis
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.201
01/01/2018

Abstract

Circuit design Computer simulation Eigenvalues Error analysis Inductance Integrated circuits Nonlinear programming Reluctance Signal integrity Sparsity Transient analysis Very large scale integration

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