- Title
- PHOTOLUMINESCENCE AND PHOTOACOUSTIC-SPECTROSCOPY OF SI SINGLE-STEP AND MULTISTEP INGOT-ANNEALED AND WAFER-ANNEALED GAAS CRYSTALS
- Creators - without role
- O KA - Cheikh Anta Diop UniversityO Oda - Electronic Materials and Components Research Laboratories, Nippon Mining Co. Ltd, Niizo Minami, Saitama 335, JapanS Shigetomi - Kurume UniversityT Ikari - University of MiyazakiY Makita - Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba 305, JapanA Yamada - Electrotechnical Laboratory, 1–1–4 Umezono, Tsukuba 305, Japan
- Contributors - without role
- S AshokJ ChevallierK SuminoE Weber
- Publication Details
- DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, Vol.262, pp.689-694
- Series
- MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
- Publisher
- Materials Research Soc
- Number of pages
- 6
- Identifiers
- 9921223108331
- Academic Unit
- King Saud Bin Abdulaziz University for Health Sciences
- Language
- English
- Resource Type
- Conference proceeding
Conference proceeding
PHOTOLUMINESCENCE AND PHOTOACOUSTIC-SPECTROSCOPY OF SI SINGLE-STEP AND MULTISTEP INGOT-ANNEALED AND WAFER-ANNEALED GAAS CRYSTALS
DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, Vol.262, pp.689-694
MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS
01/01/1992
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