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Pattern recognition in multiband imagery using stochastic expectation maximization
Conference proceeding

Pattern recognition in multiband imagery using stochastic expectation maximization

M. I. Elbakary and M. S. Alam
OPTICAL INFORMATION SYSTEMS IV, Vol.6311(1), pp.63110W-63110W-10
Proceedings of SPIE
01/01/2006

Abstract

Imaging Science & Photographic Technology Optics Physical Sciences Science & Technology Technology

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