Abstract
This paper explores the application of transparent MoOx (x<3) films as hole-collecting contacts on the rear-side of crystalline silicon solar cells. 2D simulations, which consider experimental contact recombination J(oc) and resistivity rho(c) values, demonstrate that the benefits of the MoO, based contacts are best exploited by reducing the rear contact fraction. This concept is demonstrated experimentally using simple p-type cells featuring a similar to 5% rear fraction MoOx contact. These cells attain a conversion efficiency of 20.4%, a promising result, given the early stage of development for this technology.