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Quantifying and enforcing the two-dimensional symmetry of scanning probe microscopy images of periodic objects: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS
Conference proceeding

Quantifying and enforcing the two-dimensional symmetry of scanning probe microscopy images of periodic objects: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS

Peter Moeck, Bill Moon, Mahmoud Abdel-Hafiez and Michael Hietschold
NANOTECH CONFERENCE & EXPO 2009, VOL 1, TECHNICAL PROCEEDINGS, p.314
01/01/2009

Abstract

Nanoscience & Nanotechnology Science & Technology Science & Technology - Other Topics

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