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Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects
Conference proceeding

Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images of periodic objects

P. Moeck, P. Plachinda, B. Moon, J. Straton, S. Rouvimov, M. Toader, M. Abdel-Hafiez and M. Hietschold
2009 International Semiconductor Device Research Symposium, pp.1-2
12/2009

Abstract

Chemical technology Crystallography Educational institutions Electrons Image processing Moon Orbital robotics Physics Scanning probe microscopy Two dimensional displays

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