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Real-time dual-wavelength digital holographic microscopy for MEMS characterization
Conference proceeding

Real-time dual-wavelength digital holographic microscopy for MEMS characterization

Jonas Kuhn, Tristan Colomb, Frederic Montfort, Florian Charriere, Yves Emery, Etienne Cuche, Pierre Marquet and Christian Depeursinge
OPTOMECHATRONIC SENSORS AND INSTRUMENTATION III, Vol.6716(1), pp.671608-6716010
Proceedings of SPIE
01/01/2007

Abstract

Engineering Engineering, Manufacturing Nanoscience & Nanotechnology Optics Physical Sciences Physics Physics, Applied Science & Technology Science & Technology - Other Topics Technology

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