Sign in
Real-time dual-wavelength digital holographic microscopy with a single hologram
Conference proceeding

Real-time dual-wavelength digital holographic microscopy with a single hologram

Jonas Kuehn, Tristan Colomb, Frederic Montfort, Florian Charriere and Christian Depeursinge
OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2, Vol.6616(1), pp.661615-661619
Proceedings of SPIE
01/01/2007

Abstract

Engineering Engineering, Manufacturing Instruments & Instrumentation Nanoscience & Nanotechnology Optics Physical Sciences Science & Technology Science & Technology - Other Topics Technology

Metrics

1 Record Views

Details