Reliability of Electronic Devices: Nanoscale Studies Based on the Conductive Atomic Force Microscope

Conference proceeding

2016 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW), pp.XIV-XIV

IEEE International Integrated Reliability Workshop Final Report

01/01/2016

Abstract

Engineering

Engineering, Electrical & Electronic

Science & Technology

Technology

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Title: Reliability of Electronic Devices: Nanoscale Studies Based on the Conductive Atomic Force Microscope
Creators - without role: Mario Lanza - Soochow Univ, Inst Funct Nano & Soft Mat, Suzhou, Peoples R China
IEEE
Publication Details: 2016 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW), pp.XIV-XIV
Series: IEEE International Integrated Reliability Workshop Final Report
Publisher: IEEE
Number of pages: 1
Identifiers: 9943676508331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Conference proceeding