Reliability study of power RF LDMOS for radar application

Conference proceeding

Peer reviewed

H Maanane, P Bertram, J Marcon, M Masmoudi, M Belaid, K Mourgues, P Eudeline and K Ketata

Microelectronics and reliability, Vol.44(9-11), pp.1449-1454

Reliability of electron devices, failure physics and analysis

01/09/2004

Abstract

Applied sciences

Electrical engineering. Electrical power engineering

Electronic equipment and fabrication. Passive components, printed wiring boards, connectics

Electronics

Exact sciences and technology

Power electronics, power supplies

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Transistors

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Title: Reliability study of power RF LDMOS for radar application
Creators - without role: H Maanane - Université de Rouen Normandie
P Bertram - Zentralinstitut für die Kassenärztliche Versorgung in der Bundesrepublik Deutschland
J Marcon - Université de Rouen Normandie
M Masmoudi - Université de Rouen Normandie
M Belaid - Université de Rouen Normandie
K Mourgues - Université de Rouen Normandie
P Eudeline - Zentralinstitut für die Kassenärztliche Versorgung in der Bundesrepublik Deutschland
K Ketata - Université de Rouen Normandie
Publication Details: Microelectronics and reliability, Vol.44(9-11), pp.1449-1454
Conference: Reliability of electron devices, failure physics and analysis
Publisher: Elsevier
Identifiers: 9931524208331
Academic Unit: Umm Al Qura University
Language: English
Resource Type: Conference proceeding