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Sift-ELM approach for unsupervised change detection in VHR images
Conference proceeding

Sift-ELM approach for unsupervised change detection in VHR images

Haikel Alhichri and IEEE
2014 IEEE Geoscience and Remote Sensing Symposium, pp.4699-4702
07/2014

Abstract

Change detection (CD) Classification algorithms Detectors Extreme Learning Machine (ELM) Feature extraction Image segmentation Remote sensing Scale Invariant Feature Transform (SIFT) Spatial resolution Training very high resolution (VHR)

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