Abstract
Conference Title: 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Conference Start Date: 2016, Oct. 16 Conference End Date: 2016, Oct. 19 Conference Location: Toronto, ON, Canada The developed DC space-charge life model has been used to investigate the effect of trap cross-sections and trapped charges on the aging process in polymers. The experiment was performed using a two-dimensional grid that consists of multiple squares with micro dimensions that are treated as isolated regions. This grid was used to represent the evolution of damage structures during the aging process. Similar conditions to the experimental ones were applied to the simulations in terms of the applied fields and ambient temperature. During the aging process of both investigated parameters, most of the isolated regions at low electric field are damaged and consequently the damage path direction between the electrodes is significantly affected. At the end of the aging period, acceleration of the damage path increases rapidly with increasing electric field, in contrast to the low electric field. Based on the damaged regions, it was possible to extract a threshold field from the plot of electric field versus damaged regions during aging. The simulations undertaken by varying either of the parameters gave a different lifetime to the experimental results and this is supported by physical interpretations.