Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

J Labis; H Namatame; M Taniguchi; C Kamezawa; M Hirai; M Kusaka; M Iwami

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Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

Conference proceeding

Peer reviewed

Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

J Labis, H Namatame, M Taniguchi, C Kamezawa, M Hirai, M Kusaka and M Iwami

Thin solid films, Vol.464-65, pp.107-111

ACSIN-7: Proceedings of the 7th International Symposium on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, Japan, November 16-20, 2003

2004

Abstract

Condensed matter: electronic structure, electrical, magnetic, and optical properties

Exact sciences and technology

Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation

Other interactions of matter with particles and radiation

Physics

X-ray emission spectra and fluorescence

X-ray emission threshold and fluorescence

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Title: Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study
Creators - without role: J Labis - Hiroshima University
H Namatame - Hiroshima University
M Taniguchi - Hiroshima University
C Kamezawa - Okayama University
M Hirai - Okayama University
M Kusaka - Okayama University
M Iwami - Okayama University
Publication Details: Thin solid films, Vol.464-65, pp.107-111
Conference: ACSIN-7: Proceedings of the 7th International Symposium on Atomically Controlled Surfaces, Interfaces and Nanostructures, Nara, Japan, November 16-20, 2003
Publisher: Elsevier Science
Grant note: Ministry of Education, Culture, Sports, Science and Technology Commemorative Association for the Japan World Exposition (1970) The Japan Society of Applied Physics
Identifiers: 9948159708331
Academic Unit: King Saud University
Language: English
Resource Type: Conference proceeding