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Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films
Conference proceeding   Open access  Peer reviewed

Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films

H. Mokhtari, M. Benhaliliba, M. S. Aida, N. Attaf and Y. Ocak
ICNP'1 - 1ST INTERNATIONAL CONFERENCE ON NUMERICAL PHYSICS, Vol.44, pp.03006-03006
EPJ Web of Conferences
2013

Abstract

Physical Sciences Physics Physics, Mathematical Physics, Multidisciplinary Science & Technology
url
https://doi.org/10.1051/epjconf/20134403006View
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