Sign in
Statistical Process Variation Analysis of Schottky-Barrier type GNRFET for RF Application
Conference proceeding

Statistical Process Variation Analysis of Schottky-Barrier type GNRFET for RF Application

Shital Joshi and Umar Albalawi
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.1
01/01/2017

Abstract

Computer simulation Dissipation factor Electronics Feature extraction Field effect transistors Figure of merit Graphene Local area networks Noise Q factors Semiconductor devices Wireless networks

Metrics

1 Record Views

Details