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Structural Characterization and Field Emission of Stacked-cone GaN Nanorods
Conference proceeding

Structural Characterization and Field Emission of Stacked-cone GaN Nanorods

Chun Li, Yang Huang, Yoshio Bando and Dmitri Golberg
INEC: 2010 3RD INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1 AND 2, pp.1201-1202
01/01/2010

Abstract

Engineering Engineering, Electrical & Electronic Nanoscience & Nanotechnology Science & Technology Science & Technology - Other Topics Technology

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