Abstract
Thin film of Cobalt Ferrite was deposited on Si (1 0 0) substrate using Pulsed Laser Deposition (PLD) technique. The deposited film was characterized by X-ray Diffraction (XRD), X-ray reflectivity (XRR), Rutherford Backscattering Spectroscopy (RBS) and Raman Spectroscopy and was found to be single phase, textured along (1 1 1) directions and approximately matching the stoichoimetry of the target with negligible strain. The film had a very uniform and flat surface. Raman spectroscopy measurement further confirmed the formation of single phase cubic spinel structure. T-2g Raman mode was missing from the spectra which may be due to cation redistribution and crystallite size effect.