Topological Darkness Revisited: a Four-dimensional Picture

Haomin Song; Xie Zeng; Dengxin Ji; Nan Zhang; Kai Liu; Qiaoqiang Gan; IEEE

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Conference proceeding

Topological Darkness Revisited: a Four-dimensional Picture

Haomin Song, Xie Zeng, Dengxin Ji, Nan Zhang, Kai Liu, Qiaoqiang Gan and IEEE

2015 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), Vol.2015-, pp.1-2

Conference on Lasers and Electro-Optics

01/01/2015

Abstract

Engineering

Engineering, Electrical & Electronic

Optics

Physical Sciences

Physics

Physics, Applied

Science & Technology

Technology

We present a complete description of "topological darkness" in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films. (C) 2015 Optical Society of America

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Title: Topological Darkness Revisited: a Four-dimensional Picture
Creators - without role: Haomin Song - University at Buffalo, State University of New York
Xie Zeng - University at Buffalo, State University of New York
Dengxin Ji - University at Buffalo, State University of New York
Nan Zhang - University at Buffalo, State University of New York
Kai Liu - University at Buffalo, State University of New York
Qiaoqiang Gan - University at Buffalo, State University of New York
IEEE
Publication Details: 2015 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), Vol.2015-, pp.1-2
Series: Conference on Lasers and Electro-Optics
Publisher: IEEE
Number of pages: 2
Identifiers: 9944492108331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Conference proceeding