Abstract
Hole and electron collectors in silicon heterojunction solar cells consist of hydrogenated amorphous silicon layer stacks deposited on the crystalline silicon wafer surfaces. Charge carrier extraction from these layers is achieved by electrodes consisting of a transparent conductive oxide and a metal layer. Earlier, the mere presence of the transparent conductive oxide layer on top of the hole collecting stack was shown to alter minority carrier lifetimes, at low minority injection levels, of the crystalline silicon absorber. In this work, we present a detailed investigation of the magnitude and nature of these effects and discuss their impact on silicon heterojunction solar cell performance for the different device architectures.