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Ultrasensitive Planar Metamaterials for Material Characterization Using Tapered CSRR with Application to NDT of 3D Printed Structures
Conference proceeding

Ultrasensitive Planar Metamaterials for Material Characterization Using Tapered CSRR with Application to NDT of 3D Printed Structures

Salem A. Alotaibi, Yepu Cui, Manos M. Tentzeris and IEEE
2019 49TH EUROPEAN MICROWAVE CONFERENCE (EUMC), pp.508-511
European Microwave Conference
01/01/2019

Abstract

Engineering Engineering, Electrical & Electronic Physical Sciences Physics Physics, Applied Science & Technology Technology

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