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Worst-case residual clipping noise power model for bit loading in LACO-OFDM
Conference proceeding

Worst-case residual clipping noise power model for bit loading in LACO-OFDM

Zhenyu Zhang, Anas Chaaban, Chao Shen, Hany Elgala, Tien Khee Ng, Boon S Ooi and Mohamed-Slim Alouini
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings, p.1
01/01/2018

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