Sign in
606-nm InGaN Amber Micro-Light-Emitting Diodes With an On-Wafer External Quantum Efficiency of 0.56
Journal article   Open access  Peer reviewed

606-nm InGaN Amber Micro-Light-Emitting Diodes With an On-Wafer External Quantum Efficiency of 0.56

Zhe Zhuang, Daisuke Iida, Martin Velazquez-Rizo and Kazuhiro Ohkawa
IEEE electron device letters, Vol.42(7), pp.1029-1032
07/2021

Abstract

amber micro-light-emitting diode characteristic temperature Current density Indium tin oxide InGaN Light emitting diodes on-wafer external quantum efficiency Power generation Semiconductor device measurement Temperature measurement Wavelength measurement
url
https://doi.org/10.1109/LED.2021.3080985View
Published (Version of record) Open

Metrics

1 Record Views

Details