Abstract
In this article, the generalized model for photothermal wave under dual-phase-lag model is utilized to compute the increment of temperature, the components of displacement, the carrier density and the stress components in a two-dimension semiconducting media. By using Fourier and Laplace transformations with the eigenvalue techniques methodology, the exact solutions of all physical quantities are obtained. A semiconductor media such as silicon has been studied. Finally, the outcomes are represented graphically to display the difference among the models of classical dynamical coupled, the Lord and Shulman and the dual phase lag.