Abstract
The construction of a high voltage electron microscope aiming at observing high-resolution crystal structure images is reported. It can resolve the lattice fringes of 2.04 Å spacing at the accelerating voltage of 1,000 kV under the axial illumination with using a specimen goniometer. The instrumental conditions required and the technical improvements achieved at the construction are described. Some images obtained by the microscope are shown to point out the characteristic features as compared to those by ordinary100 kV electron microscopes. The effect of spherical and chromatic aberration is discussed.