A METHOD FOR EVALUATING HOW WELL OBSERVED DATA FIT LINE Y = X

Journal article

A METHOD FOR EVALUATING HOW WELL OBSERVED DATA FIT LINE Y = X

MATERIALS RESEARCH AND STANDARDS, Vol.7(5), p.195

01/01/1967

Abstract

Crystallography

Materials Science

Materials Science, Characterization & Testing

Materials Science, Multidisciplinary

Physical Sciences

Science & Technology

Technology

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Details

Title: A METHOD FOR EVALUATING HOW WELL OBSERVED DATA FIT LINE Y = X
Creators - without role: S Popovics
Publication Details: MATERIALS RESEARCH AND STANDARDS, Vol.7(5), p.195
Publisher: MATERIALS RESEARCH SOCIETY
Number of pages: 0
Identifiers: 9936319508331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article