Abstract
Motivated by an accelerated degradation test (ADT) on the power gain of microwave power amplifiers, in this article we propose a model-ranking approach for the estimation of some important reliability characteristics. Different degradation models and statistical lifetime distributions are applied to model the data obtained from the ADT. We study the effect of model misspecification in estimating the reliability characteristics when the behavior of the degradation process and the underlying degradation-data-generating mechanism are unknown. We then propose a model-ranking approach with weighted estimation procedures when multiple candidate models are under consideration. Through a Monte Carlo simulation study, we show that the proposed approach is robust and insensitive to model misspecification. Finally, the ADT data from the motivating example are used to illustrate the proposed methodologies.