Abstract
We have presented the borophene based refractive index sensor for the infrared frequency spectrum of 188 to 250 THz (1.2–1.6 µm) range. The proposed structure was formed by using the Silver-borophene-silica-Ag layered structure. The behaviour of the different analyte (with a different refractive index) material is numerically calculated by placing it on the top of the structure. The behaviour of the structure is identified in terms of absorption, reflectance, physical parameter variation, and oblique angle incident conditions. The presented results provide the basic idea of selecting optimized structure dimensions to get the specific resonating response. This sensor offers the Figure of Merit (FOM) of 444 RIU−1 with high sensitivity of 660 THz/RIU (4471 nm/RIU). The refractive index sensor also provides wide-angle stability for (0° to 80°) for the wide frequency range (239 to 245 THz and 207 to 209 THz). This sensor is developed on the silver metal layer (not required to separate borophene from its origin metal deposition process) and easily fabricated using standard boron fabrication and layered deposition techniques. The results of the proposed structure make it possible to design a basic biosensor structure. This device is also applicable for various THz and biomedical applications.