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A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution
Journal article   Open access  Peer reviewed

A New Control Chart for Monitoring Reliability Using Sudden Death Testing Under Weibull Distribution

Muhammad Aslam, Osama H. Arif and Chi-Hyuck Jun
IEEE access, Vol.5, pp.23358-23365
01/01/2017
DOI: https://doi.org/10.1109/ACCESS.2017.2764953

Abstract

Computer Science Computer Science, Information Systems Engineering Engineering, Electrical & Electronic Science & Technology Technology Telecommunications
In this paper, a new control chart using sudden death testing is designed by assuming that the lifetime/failure time of the product follows the Weibull distribution. The structure of the proposed chart is presented. The control chart coefficient is determined using some specified average run length for the in control process and the shifted process. Simulation study is given for the illustration purpose.
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https://doi.org/10.1109/ACCESS.2017.2764953View
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