A Newly Developed 300 kV Field-Emission Analytical Transmission Electron Microscope

Journal article

Peer reviewed

Yoshio Bando, Yoshizo Kitami, Takeshi Tomita, Toshikazu Honda and Yukihisa Ishida

Japanese Journal of Applied Physics, Vol.32(Part 2, No. 11B), pp.L1704-L1706

15/11/1993

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Title: A Newly Developed 300 kV Field-Emission Analytical Transmission Electron Microscope
Creators - without role: Yoshio Bando
Yoshizo Kitami
Takeshi Tomita - JEOL
Toshikazu Honda - JEOL
Yukihisa Ishida - JEOL
Publication Details: Japanese Journal of Applied Physics, Vol.32(Part 2, No. 11B), pp.L1704-L1706
Identifiers: 9952040008331
Academic Unit: King Saud University
Language: English
Resource Type: Journal article