A Review on Principles and Applications of Scanning Thermal Microscopy (SThM)

Journal article

Peer reviewed

Yun Zhang, Wenkai Zhu, Fei Hui, Mario Lanza, Theodorian Borca-Tasciuc and Miguel Muñoz Rojo

Advanced functional materials, Vol.30(18), pp.1900892-n/a

04/05/2020

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Title: A Review on Principles and Applications of Scanning Thermal Microscopy (SThM)
Creators - without role: Yun Zhang - Rensselaer Polytechnic Institute
Wenkai Zhu - Mechanical, Aerospace and Nuclear Engineering DepartmentRensselaer Polytechnic Institute 110 Eighth Street Troy NY 12180 USA
Fei Hui - Technion – Israel Institute of Technology
Mario Lanza - Soochow University
Theodorian Borca-Tasciuc - Rensselaer Polytechnic Institute
Miguel Muñoz Rojo - Department of Thermal and Fluid EngineeringUniversity of Twente Enschede 7500 AE The Netherlands
Publication Details: Advanced functional materials, Vol.30(18), pp.1900892-n/a
Identifiers: 9942617408331
Academic Unit: King Abdullah University of Science & Technology
Language: English
Resource Type: Journal article