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A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors
Journal article   Open access  Peer reviewed

A Rigorous Temperature-Dependent Stochastic Modelling and Testing for MEMS-Based Inertial Sensor Errors

Mohammed El-Diasty and Spiros Pagiatakis
Sensors (Basel, Switzerland), Vol.9(11), pp.8473-8489
01/11/2009
PMCID: PMC3260596
PMID: 22291519

Abstract

Chemistry Chemistry, Analytical Engineering Engineering, Electrical & Electronic Instruments & Instrumentation Physical Sciences Science & Technology Technology
url
https://doi.org/10.3390/s91108473View
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