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A Wiener process model with truncated normal distribution for reliability analysis
Journal article   Open access  Peer reviewed

A Wiener process model with truncated normal distribution for reliability analysis

Donghui Pan, Jia-Bao Liu, Fanglun Huang, Jinde Cao and Ahmed Alsaedi
Applied mathematical modelling, Vol.50, pp.333-346
10/2017

Abstract

Degradation model Expectation maximization Reliability Truncated normal distribution Wiener process
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https://doi.org/10.1016/j.apm.2017.05.049View
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