Abstract
A newly fabricated characterization station is presented. It is a compact, cost-effective, and easily adjustable apparatus. Each part including 4-pin probe, manipulators, operating temperature, and applied bias can be independently controlled. The station can provide highly reliable, reproducible, and economical methods to quickly conduct and complete the characterizations of a large amount of sensing materials within a short period of time. It is particularly suitable for studies of various nanostructured materials and their related thermal effect, polarization effect, sensitivity, and electrical and electronic properties. Published by AIP Publishing.