A light reflectance technique for thickness measurements of passive films

Journal article

Peer reviewed

M Büchler, P Schmuki and H Böhni

Electrochimica acta, Vol.43(5-6), pp.635-637

01/01/1998

Abstract

Applied sciences

Chemistry

Corrosion

Corrosion mechanisms

Electrochemistry

Electrodes: preparations and properties

Exact sciences and technology

General and physical chemistry

Metals. Metallurgy

Other electrodes

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Title: A light reflectance technique for thickness measurements of passive films
Creators - without role: M Büchler - École Polytechnique Fédérale de Lausanne
P Schmuki - École Polytechnique Fédérale de Lausanne
H Böhni - École Polytechnique Fédérale de Lausanne
Publication Details: Electrochimica acta, Vol.43(5-6), pp.635-637
Publisher: Elsevier
Identifiers: 9934151308331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article