Sign in
A lot inspection sampling plan based on EWMA yield index
Journal article   Peer reviewed

A lot inspection sampling plan based on EWMA yield index

Ching-Ho Yen, Muhammad Aslam and Chi-Hyuck Jun
International journal of advanced manufacturing technology, Vol.75(5-8), pp.861-868
01/11/2014

Abstract

Automation & Control Systems Engineering Engineering, Manufacturing Science & Technology Technology

Metrics

1 Record Views

Details