Abstract
Field effect transistors using a poly(triaryl amine) p-channel organic semiconductor in conjunction with anodised aluminium oxide as the gate insulator (Al
2O
3 on Al) are demonstrated. Anodised films are pinhole-free, homogenous oxide layers of precisely controlled thickness. The anodisation process requires no vacuum steps; anodised Al
2O
3 is insoluble in organic solvents, and Al films are cheaply available as laminates on flexible substrates. Anodised Al
2O
3 is confirmed to have high gate capacitance (≈60 nF/cm
2) and electric breakdown strength (>3 MV/cm in the working device). This property profile answers to the demands on gate insulators for flexible electronics applications.