Abstract
FRACTIONAL DERIVATIVE MODELS (FDMs) result from introduction of fractional derivatives (FDs) into the governing equations of the differential operator type of linear solid materials. FDMs are more general than those of integer derivative models (IDMs) so they are more fixable to describe physical phenomena. In this paper the inhomogeneous nonlocal theory has been introduced based on conformable fractional derivatives (CFD) to study the critical point instability of micro/nano beams under a distributed variable-pressure force. The phase of distributed variable-pressure force is used for electrostatic force, electromagnetic force and so on. This model has two free parameters: i) parameter to control the order of inhomogeneity in constitutive relation that gives a general form to the model, and ii) a nonlocal parameter to consider size dependence effects in micron and sub-micron scales. As a case study the theory has been used to model micro cantilever (C-F) and doubly-clamped (C-C) silicon beams under a distributed uniform electrostatic force in the presence of von-Karman non-linearity and their static critical point (static pull-in instability), moreover, effects of different inhomogeneity have been shown on the pull-in instability.