A systematic approach for extracting lumped circuit parameters of microstrip discontinuities from their S-parameter characteristics

Journal article

Peer reviewed

R. Mittra, A. Suntives, M. S. Hossain and J. Ma

International journal of numerical modelling, Vol.15(1), pp.59-72

01/2002

Abstract

artificial neural network

genetic algorithm

lumped equivalent circuit

microstrip discontinuity

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Title: A systematic approach for extracting lumped circuit parameters of microstrip discontinuities from their S-parameter characteristics
Creators - without role: R. Mittra - Pennsylvania State University
A. Suntives - Pennsylvania State University
M. S. Hossain - Pennsylvania State University
J. Ma - Pennsylvania State University
Publication Details: International journal of numerical modelling, Vol.15(1), pp.59-72
Publisher: John Wiley & Sons, Ltd
Number of pages: 14
Identifiers: 9935333008331
Academic Unit: King Abdulaziz University
Language: English
Resource Type: Journal article