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A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates
Journal article   Peer reviewed

A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates

Qun Huang, Rui Xu, Yin Liu, Heng Hu, Gaetano Giunta, Salim Belouettar and Michel Potier-Ferry
Thin-walled structures, Vol.114, pp.144-153
05/2017

Abstract

Asymptotic numerical method Film/substrate system Fourier series Wrinkling

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