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A variable sampling plan using generalized multiple dependent state based on a one-sided process capability index
Journal article   Peer reviewed

A variable sampling plan using generalized multiple dependent state based on a one-sided process capability index

G. Srinivasa Rao, Muhammad Aslam and Chi-Hyuck Jun
Communications in statistics. Simulation and computation, Vol.50(9), pp.2666-2677
02/09/2021

Abstract

Average sample number Inspection Lot sentencing Multiple dependent state Risk

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