Abstract
In this study, we propose three new sampling plans based on yield index C-puA for linear profiles with one-sided specifications, including the resubmitted sampling plan, the repetitive group sampling plan, and the multiple dependent state repetitive sampling plan. The operating characteristic functions of our proposed sampling plans are developed. The plan parameters of our proposed sampling plans are determined through nonlinear optimization. The plan parameters are reported for various combinations of acceptable quality level and limiting quality level. The three sampling plans are compared with the existing single sampling plan in terms of the average sample number. A real example is used to illustrate the applications.