Sign in
Adaptive Memory Control Charts Constructed on Generalized Likelihood Ratio Test to Monitor Process Location
Journal article   Peer reviewed

Adaptive Memory Control Charts Constructed on Generalized Likelihood Ratio Test to Monitor Process Location

Babar Zaman, Muhammad Hisyam Lee, Muhammad Riaz, Mu'azu Ramat Abujiya, Rashid Mehmood and Nasir Abbas
Arabian journal for science and engineering (2011), Vol.47(11), pp.15049-15081
01/11/2022

Abstract

Multidisciplinary Sciences Science & Technology Science & Technology - Other Topics

Metrics

1 Record Views

Details