Abstract
It is well known that the thermodynamic characteristics of thin fluid films significantly differ from those for the same fluid in the bulk condition. Particularly, the pressure in film differs from the bulk value on a quantity, which depends on the film thickness. The film thickness during the evaporation process will directly determine heat transfer and fluid flow in the evaporating thin-film region. A unique experimental system was constructed to investigate the effect of heat flux on the film thickness in the evaporating thin-film region. The film thickness near the interline region was measured using one-spot thin-film analyzer F20. Temperatures at the liquid-vapor interface near the interline region were measured using the MIKRON infrared camera. Experimental results show that as the input power increases the film thickness near the interline region decreases, which is similar to the theoretical prediction.