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An in-depth investigation of physical properties of Nd doped CdS thin films for optoelectronic applications
Journal article   Peer reviewed

An in-depth investigation of physical properties of Nd doped CdS thin films for optoelectronic applications

Kamlesh V. Chandekar, Mohd Shkir, T. Alshahrani, Aslam Khan and S. AlFaify
Chinese journal of physics (Taipei), Vol.67, pp.681-694
10/2020

Abstract

Dielectric properties Nd@CdS thin films Non-linear optical properties Optical properties X-ray diffraction

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