Abstract
In current article authors aim is to present an insight on structural, opto-nonlinear-limiting properties of Cadmium sulfide (CdS) thin films affected by various concentrations of tellurium (Te) doping. Hence, the thin films of pure and Te:CdS were fabricated by spray pyrolysis technique by keeping the substrate at 300 degrees C. X-ray diffraction and FT-Raman spectroscopy analyses confirmed the hexagonal phase of CdS. The values of L-ave, rho(ave) and epsilon(ave) are found in range of 18-20 nm, 2.6-3 nm(-2) and 1.7-1.9, respectively. Furthermore, the energy dispersive X-ray spectroscopy/scanning electron microscopy mapping (SEM) confirmed the presence and homogeneous doping of Te in CdS. SEM study shows that the fabricated films are free from any pin holes and possess very fine nanostructures. The optical transparency of grown films was noticed similar to 70%, which is quite impressive for colored materials. The absorption index, refractive index values are found in range of 0.04 to 0.25, 1.25 to 3.2 in 200 to 2500 nm wavelength region. The direct energy gap of CdS was noticed to be reduced from 2.44 to 2.35 eV (Delta E-g = 0.09) with Te doping content. Photoluminescence emission spectra contains an intense green emission band at similar to 528 +/- 4 nm. The dielectric constant and optical conductivity were noticed in range of 1.5 to 10 and 0.02 to 0.6 (x 10(5)), respectively. The values of third order susceptibility and nonlinear refractive index was found of the order of 10(-10) esu. The output power of the 532 nm laser passed from films is found to be reducing with increasing the Te content in CdS films. Hence, the deposited films of Te:CdS will be more applicable as optical limiter in sensor device protection from intense lights.