Abstract
In this paper, we present a simple technique for analyzing the mutual coupling effects in interconnects using the Finite Difference Time Domain (FDTD) method. The interconnect lines are divided into a set of uniform segments of parallel lines with short lengths. Next, the mutual capacitances and inductances of each of these segments are extracted by incorporating the FDTD solution into the telegrapher's equations. Two examples of coplanar lines and microstrip fines on different dielectric substrates are studied.