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Atomic force microscopy-induced nanopatterning of Si(100) surfaces
Journal article   Peer reviewed

Atomic force microscopy-induced nanopatterning of Si(100) surfaces

L Santinacci, T Djenizian and P Schmuki
Journal of the Electrochemical Society, Vol.148(9), pp.C640-C646
01/09/2001

Abstract

Applied sciences Cross-disciplinary physics: materials science; rheology Electrodeposition, electroplating Electronics Exact sciences and technology Materials science Metals. Metallurgy Methods of deposition of films and coatings; film growth and epitaxy Microelectronic fabrication (materials and surfaces technology) Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

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